用40，000颗星的抖动阵列绘制厚CCD中的电荷输运效应
Mapping charge transport effects in thick CCDs with a dithered array of 40,000 stars
摘要：
我们在实验室中使用LSST观测的台式模拟来表征厚的、完全耗尽的CCD的边缘处的天体测量失真。通过在f/1.2光学再成像仪的物面上照射直径为30 μ m的4万个针孔阵列，可以在4K × 4K像素的CCD上成像数千个PSF。每个高纯度硅像素，10 μ m平方米，100 μ m深，然后可以单独通过一系列的子像素抖动在X/Y平面的特点。可以研究每个像素作为通量、波长、背侧偏置等的函数的独特特征[响应、位置、形状]。我们测量的幅度和发病的天体测量误差的检测器的边缘作为一个测试的实验装置，使用LSST原型CCD。我们发现，这种天体测量误差的边缘是来源于非均匀性的电场线，定义像素边界。为了优化弱引力透镜和LSST的大尺度结构测量的科学输出，必须校正这种边缘失真。
英文摘要：
We characterize the astrometric distortion at the edges of thick, fully-depleted CCDs in the lab using a bench-top simulation of LSST observing. By illuminating an array of forty thousand pinholes (30mu m diameter) at the object plane of a f/1.2 optical reimager, thousands of PSFs can be imaged over a 4Kx4K pixel CCD. Each high purity silicon pixel, 10mu m square by 100mu m deep, can then be individually characterized through a series of sub-pixel dithers in the X/Y plane. The unique character [response, position, shape] of each pixel as a function of flux, wavelength, back side bias, etc. can be investigated. We measure the magnitude and onset of astrometric error at the edges of the detector as a test of the experimental setup, using a LSST prototype CCD. We show that this astrometric error at the edge is sourced from non-uniformities in the electric field lines that define pixel boundaries. This edge distortion must be corrected in order to optimize the science output of weak gravitational lensing and large scale structure measurements for the LSST.
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