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arXiv 2201.05850cond-mat.mtrl-scicond-mat.mes-hallphysics.comp-phphysics.data-an
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Pattern Recognition for the Electronic Phase of Bismuth Antimony Thin Films

Shuang Tang, Lucy Dow, Emmanuel Ojukwu

英文摘要:

There are many applications involving the use of bismuth antimony thin films. However, due to the low crystalline symmetry and strong coupling between the electronic band edges, it has always been challenging to infer the electronic phase of such a material. Fortunately, with the development of pattern recognition technology, scientists can build many black-box tools for predicting various materials properties. In this present work, we have developed several pattern recognition tools to predict the electronic phase of a bismuth antimony thin film. The support vector machine, the decision tree, and the artificial neural network are used to achieve a prediction accuracy of ~90%, ~95% and ~100%, respectively.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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