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arXiv 2110.02759cond-mat.mtrl-scicond-mat.mes-hall
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拓扑材料ZrTe5薄片磁电阻的交叉行为

Crossover behavior in the magnetoresistance of thin flakes of the topological material ZrTe5

Zhijian Xie, Xinjian Wei, Xiaobin Qiang, Yu Zhang, Shili Yan, Shimin Cao, Congkuan Tian, Peipei Wang, Liyuan Zhang, G. D. Gu, Haizhou Lu, Jian-Hao Chen

摘要:

ZrTe5是一种具有复杂拓扑效应的层状材料。密集的理论和实验努力已经投入到试图理解这种材料的物理。本文研究了ZrTe_5薄片的磁输运性质随温度的变化。在饱和霍尔反常、手征反常和纵向磁电阻三种不同类型的磁电阻随温度的变化关系中同时观察到一个特征温度T*。随着ZrTe_5薄片厚度从42 nm增加到89 nm,T_* 值从200 K单调下降到160 K。温度诱导的拓扑相变是导致T* 处三种类型磁电阻异常的原因。我们的研究结果提供了一个多参数指标的拓扑相变的出现在ZrTe 5,并可以扩展到其他拓扑材料的研究。这三种类型的磁阻的温度依赖性也揭示了反常霍尔效应在ZrTe 5的输运性质中的作用。

英文摘要:

ZrTe5 is a layered material that exhibits intricate topological effects. Intensive theoretically and experimental efforts have been devoted to try to understand the physics in this materials. In this paper the temperature dependent magneto-transport properties of ZrTe5 thin flakes are investigated. A characteristic temperature T* is observed in the temperature dependence of three different types of magnetoresistance simultaneously, which are the saturated Hall anomaly, the chiral anomaly and the longitudinal magnetoresistance. Furthermore, the value of T* decreases monotonically from 200K to 160K with increasing thickness of the ZrTe5 thin flakes from 42nm to 89nm. Temperature induced topological phase transitions are attributed to the cause of such anomaly in the three types of magnetoresistance at T*. Our findings provide a multi-parameter indicator for the emergence of topological phase transition in ZrTe5 and could be extended to the study of other topological materials. The temperature dependence of the three types of magnetoresistance also shed light on the role of anomalous Hall Effect in the transport properties of ZrTe5.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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