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arXiv 2107.04800cond-mat.mes-hall
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高阶拓扑绝缘体角态的各向异性穿透深度

Anisotropic Penetration Depths of Corner States in a Higher-Order Topological Insulator

Nobuhiro Arai, Shuichi Murakami

摘要:

二维中的高阶拓扑绝缘体具有局部化在其角上的状态,称为角状态。本文利用Benalcazar-Bernevig-Hughes模型揭示了它们角态的穿透深度特征。首先,我们表明,当我们改变的能量的角状态向边缘间隙的末端,通过增加一个现场潜在的角落网站,沿边缘的穿透深度发散向无穷大,而进入散装的穿透深度保持有限。我们解析推导出的角状态波函数的椭圆积分的形式,再现角状态的各向异性行为。这意味着角状态有两种穿透深度,并且它们的行为不同。最后,我们证明了角态之间的杂交是由角态之间的干涉穿透深度决定的。这是因为角态几乎不干扰边缘态或体态。

英文摘要:

Higher-order topological insulators in two dimensions have states that localize at their corners, called corner states. In this paper, we reveal characteristics of the penetration depth of their corner states by using the Benalcazar-Bernevig-Hughes model. First, we show that when we change the energy of the corner states toward the end of the edge gap by adding an on-site potential to the corner site, the penetration depth along the edge diverges toward infinity while the penetration depth into the bulk remaining finite. We analytically derive the corner-state wavefunction in a form of elliptic integrals, which reproduces this anisotropic behavior of corner states. This means that corner states have two kinds of penetration depths, and they behave differently. At last, we show that hybridizations between corner states are governed by the penetration depth through interference between the corner states. It is because the corner states almost do not interfere with edge states or bulk states.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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