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arXiv 2103.01491quant-ph
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Cryogenic single-port calibration for superconducting microwave resonator measurements

Haozhi Wang, S. Singh, C. R. H. McRae, J. C. Bardin, S. -X. Lin, N. Messaoudi, A. R. Castelli, Y. J. Rosen, E. T. Holland, D. P. Pappas, J. Y. Mutus

英文摘要:

Superconducting circuit testing and materials loss characterization requires robust and reliable methods for the extraction of internal and coupling quality factors of microwave resonators. A common method, imposed by limitations on the device design or experimental configuration, is the single-port reflection geometry, i.e. reflection-mode. However, impedance mismatches in cryogenic systems must be accounted for through calibration of the measurement chain while it is at low temperatures. In this paper, we demonstrate a data-based, single-port calibration using commercial microwave standards and a vector network analyzer (VNA) with samples at millikelvin temperature in a dilution refrigerator, making this method useful for measurements of quantum phenomena. Finally, we cross reference our data-based, single-port calibration and reflection measurement with over-coupled 2D- and 3D-resonators against well established two-port techniques corroborating the validity of our method.

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