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arXiv 2102.08336quant-ph
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一种减少硬件泄漏的超导transmon量子比特量子纠错方案

A hardware-efficient leakage-reduction scheme for quantum error correction with superconducting transmon qubits

Francesco Battistel, Boris M. Varbanov, Barbara M. Terhal

摘要:

量子比特计算子空间外的泄漏对量子纠错(QEC)提出了严峻的挑战。我们提出了一个方案,使用两个泄漏减少单元(LRU),减轻这些问题的transmon为基础的表面码,而不需要在硬件或质量控制周期的时间方面的开销,在以前的建议。对于数据量子比特,我们考虑微波驱动器将泄漏转移到读出谐振器,在那里它迅速衰减,确保这对实际系统参数的计算子空间内的相干性的影响可以忽略不计。对于辅助量子位,我们应用以测量结果为条件的$|1\rangle\leftrightarrow|2\rangle$ $π$脉冲。使用密度矩阵模拟的距离-3表面码,我们表明,平均泄漏寿命减少到几乎1 QEC周期,即使当LRU实现有限的保真度。此外,我们还表明这会显着降低逻辑错误率。这种LRU方案为近期可扩展的QEC演示开辟了前景。

英文摘要:

Leakage outside of the qubit computational subspace poses a threatening challenge to quantum error correction (QEC). We propose a scheme using two leakage-reduction units (LRUs) that mitigate these issues for a transmon-based surface code, without requiring an overhead in terms of hardware or QEC-cycle time as in previous proposals. For data qubits we consider a microwave drive to transfer leakage to the readout resonator, where it quickly decays, ensuring that this negligibly affects the coherence within the computational subspace for realistic system parameters. For ancilla qubits we apply a $|1\rangle\leftrightarrow|2\rangle$ $π$ pulse conditioned on the measurement outcome. Using density-matrix simulations of the distance-3 surface code we show that the average leakage lifetime is reduced to almost 1 QEC cycle, even when the LRUs are implemented with limited fidelity. Furthermore, we show that this leads to a significant reduction of the logical error rate. This LRU scheme opens the prospect for near-term scalable QEC demonstrations.

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