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arXiv 2012.00832physics.acc-ph
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Transverse beam emittance measurement by undulator radiation power noise

Ihar Lobach, Sergei Nagaitsev, Valeri Lebedev, Aleksandr Romanov, Giulio Stancari, Alexander Valishev, Aliaksei Halavanau, Zhirong Huang, Kwang-Je Kim

英文摘要:

Generally, turn-to-turn power fluctuations of incoherent spontaneous synchrotron radiation in a storage ring depend on the 6D phase-space distribution of the electron bunch. In some cases, if only one parameter of the distribution is unknown, this parameter can be determined from the measured magnitude of these power fluctuations. In this Letter, we report an absolute measurement (no free parameters or calibration) of a small vertical emittance (5--15 nm rms) of a flat beam by this method, under conditions, when it is unresolvable by a conventional synchrotron light beam size monitor.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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