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arXiv 2010.03079cond-mat.mtrl-sci
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N极GaN/AlN共振隧穿二极管

N-polar GaN/AlN resonant tunneling diodes

YongJin Cho, Jimy Encomendero, Shao-Ting Ho, Huili Grace Xing, Debdeep Jena

摘要:

采用等离子体辅助分子束外延技术在单晶N极性GAN衬底上实现了N极性GAN/AlN共振隧穿二极管。室温下的电流-电压特性揭示了一个负微分电导(NDC)区,在正向偏压为~8 V时,峰值隧穿电流为6.8 $\pm$ 0.8 kA/cm $^2$。在~ $-$ 4 V处测得极化感生阈值电压。用与金属相反的极化场很好地解释了这些谐振和阈值电压。极性对应物,确认RTD的N极性。当器件在NDC区偏置时,在外部电路中产生电子振荡,证明了共振隧穿现象的鲁棒性。与金属极性RTD相比,N极性结构的发射极位于共振隧穿腔的顶部。因此,这种器件架构开辟了通过共振隧穿注入$-$与III族氮化物半导体无缝连接$-$的可能性,为探索新的器件物理提供了一条途径。

英文摘要:

N-polar GaN/AlN resonant tunneling diodes are realized on single-crystal N-polar GaN bulk substrate by plasma-assisted molecular beam epitaxy growth. The room-temperature current-voltage characteristics reveal a negative differential conductance (NDC) region with a peak tunneling current of 6.8$\pm$ 0.8 kA/cm$^2$ at a forward bias of ~8 V. Under reverse bias, the polarization-induced threshold voltage is measured at ~$-$4 V. These resonant and threshold voltages are well explained with the polarization field which is opposite to that of the metal-polar counterpart, confirming the N-polarity of the RTDs. When the device is biased in the NDC-region, electronic oscillations are generated in the external circuit, attesting to the robustness of the resonant tunneling phenomenon. In contrast to metal-polar RTDs, N-polar structures have the emitter on the top of the resonant tunneling cavity. As a consequence, this device architecture opens up the possibility of seamlessly interfacing$-$via resonant tunneling injection$-$a wide range of exotic materials with III-nitride semiconductors, providing a route to explore new device physics.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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