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arXiv 2009.07097physics.plasm-ph
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介电陷阱态在电容耦合射频等离子体放电中的作用:动态充电行为

Unveiling the role of dielectric trap states on capacitively coupled radio-frequency plasma discharge: dynamic charging behaviors

Shu Zhang, Guang-Yu Sun, Volčokas Arnas, Guan-Jun Zhang, An-Bang Sun

摘要:

从理论和Particleincell/MonteCarlo碰撞模拟两方面研究了介质边界材料中电荷陷阱态对电容耦合射频等离子体放电的影响。研究发现,壁材料的陷阱态主要通过改变固体边界内积累的动态表面电荷引起的离子感生次级电子发射(SEE)系数来控制放电特性。首先建立了一个考虑表面荷电的综合SEE模型,该模型综合考虑了价带电子分布、电子陷阱密度以及通过俄歇中和和去激发捕获的电荷。理论分析揭示了陷阱态对鞘层溶液、稳定性、等离子体密度和温度、粒子和功率平衡等的影响。模拟结果表明,随着电荷相关发射系数的增加,平均射频鞘层电势降低。随着气体压力的增加,观察到的位移的最大电离率从体等离子体中心的等离子体鞘层界面,这也是由陷阱状态的电极材料的位移发生在一个较低的压力与陷阱考虑。此外,电荷陷阱有助于产生几何对称结构的非对称等离子体放电,这种效应在γ模放电中更为明显。

英文摘要:

The influence of charge trap states in the dielectric boundary material on capacitively coupled radio frequency plasma discharge is investigated with theory and Particle in cell/Monte Carlo Collision simulation. It is found that the trap states of the wall material manipulated discharge properties mainly through the varying ion induced secondary electron emission (SEE) coefficient in response to dynamic surface charges accumulated within solid boundary. A comprehensive SEE model considering surface charging is established first, which incorporates the valence band electron distribution, electron trap density, and charge trapping through Auger neutralization and de-excitation. Theoretical analysis is carried out to reveal the effects of trap states on sheath solution, stability, plasma density and temperature, particle and power balance, etc. The theoretical work is supported by simulation results, showing the reduction of the mean radio frequency sheath potential as charging-dependent emission coefficient increases. As the gas pressure increases, a shift of the maximum ionization rate from the bulk plasma center to the plasma-sheath interface is observed, which is also influenced by the trap states of the electrode material where the shift happens at a lower pressure with traps considered. In addition, charge traps are proved helpful for creating asymmetric plasma discharges with geometrically symmetric structures, such effect is more pronounced in γ mode discharges.

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