arXivDaily arXiv每日学术速递 周一至周五更新
arXiv周末暂无论文更新,休息一下吧,周末愉快~~
arXiv 2008.05051quant-phcs.ITmath.IT
收藏

短型综合征序列

Short Shor-style syndrome sequences

Nicolas Delfosse, Ben W. Reichardt

摘要:

我们优化容错量子纠错,以减少故障位测量的数量。加速纠错也将加速编码量子计算,并应降低其有效错误率。我们给出了代码特定的和一般的方法,使用各种技术和各种设置。我们设计了新的量子纠错码,专门用于有效的纠错,例如,允许单次误差校正。对于具有多个逻辑量子比特的码,我们给出了纠错与部分逻辑测量相结合的方法。在选择代码和纠错技术时需要权衡。虽然到目前为止,大多数工作都集中在优化的综合征提取过程中,我们表明,也有大量的好处,优化如何测量综合征的选择和使用。作为一个例子,我们设计了单次测量序列的容错量子纠错与16量子比特扩展汉明码。我们的计划使用10个综合征位测量,相比之下,40测量与Shor计划。我们还设计了单次逻辑测量:任何逻辑Z测量都可以与仅使用11次测量的容错纠错一起进行。为了比较,使用Shor方案,这种非破坏性逻辑测量的基本实现使用63个测量。我们还提供了10个开放的问题,这些问题的解决方案可能会导致容错纠错的实质性改进。

英文摘要:

We optimize fault-tolerant quantum error correction to reduce the number of syndrome bit measurements. Speeding up error correction will also speed up an encoded quantum computation, and should reduce its effective error rate. We give both code-specific and general methods, using a variety of techniques and in a variety of settings. We design new quantum error-correcting codes specifically for efficient error correction, e.g., allowing single-shot error correction. For codes with multiple logical qubits, we give methods for combining error correction with partial logical measurements. There are tradeoffs in choosing a code and error-correction technique. While to date most work has concentrated on optimizing the syndrome-extraction procedure, we show that there are also substantial benefits to optimizing how the measured syndromes are chosen and used. As an example, we design single-shot measurement sequences for fault-tolerant quantum error correction with the 16-qubit extended Hamming code. Our scheme uses 10 syndrome bit measurements, compared to 40 measurements with the Shor scheme. We design single-shot logical measurements as well: any logical Z measurement can be made together with fault-tolerant error correction using only 11 measurements. For comparison, using the Shor scheme a basic implementation of such a non-destructive logical measurement uses 63 measurements. We also offer ten open problems, the solutions of which could lead to substantial improvements of fault-tolerant error correction.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑