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arXiv 2007.07574cond-mat.mtrl-scicond-mat.mes-hallcond-mat.str-el
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Ultrafast nano-imaging of the order parameter in a structural phase transition

Thomas Danz, Till Domröse, Claus Ropers

英文摘要:

Understanding microscopic processes in materials and devices that can be switched by light requires experimental access to dynamics on nanometer length and femtosecond time scales. Here, we introduce ultrafast dark-field electron microscopy, tailored to map the order parameter across a structural phase transition. We track the evolution of charge-density wave domains in 1T-TaS2 after ultrashort laser excitation, elucidating relaxation pathways and domain wall dynamics. The unique benefits of selective contrast enhancement will inspire future beam shaping technology in ultrafast transmission electron microscopy.

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