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arXiv 2007.03816cond-mat.mtrl-sci
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微扰方法在从头计算有效质量中的应用

Perturbation approach to ab initio effective mass calculations

Oleg Rubel, Fabien Tran, Xavier Rocquefelte, Peter Blaha

摘要:

在全电子密度泛函理论(DFT)软件包WIEN 2k中实现了简并微扰$k\cdot p$方法计算有效质量.在IVA、IIIA-VA和IIB-VIA主族半导体材料上测试准确度。然后,在石墨烯和CuI与缺陷的有效质量作为说明性的应用。对于具有显著Cu-d特征的状态,必须将具有更高主量子数(更多径向节点)的附加局部轨道添加到基组,以便收敛微扰理论的结果。与速度和动量矩阵元素之间的差异有关的警告进行了讨论的上下文中的应用程序的方法,以非本地的潜力,如Hartree-Fock/DFT混合泛函和DFT+U。

英文摘要:

A degenerate perturbation $k\cdot p$ approach for effective mass calculations is implemented in the all-electron density functional theory (DFT) package WIEN2k. The accuracy is tested on major group IVA, IIIA-VA, and IIB-VIA semiconductor materials. Then, the effective mass in graphene and CuI with defects is presented as illustrative applications. For states with significant Cu-d character additional local orbitals with higher principal quantum numbers (more radial nodes) have to be added to the basis set in order to converge the results of the perturbation theory. Caveats related to a difference between velocity and momentum matrix elements are discussed in the context of application of the method to non-local potentials, such as Hartree-Fock/DFT hybrid functionals and DFT+U.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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