arXiv 2006.006552020-06physics.atom-ph

短脉冲红外辐射对氩原子激发和电离的椭圆度效应

Ellipticity Dependence of Excitation and Ionization of Argon Atoms by Short-Pulse Infrared Radiation

Thomas Pauly, Aaron Bondy, Kathryn R. Hamilton, Nicolas Douguet, Xiao-Min Tong, Dashavir Chetty, K. Bartschat

备注：: 7 pages, 4 figures
发表信息：: Phys. Rev. A 102, 013116 (2020)
DOI：: 10.1103/PhysRevA.102.013116

摘要：

当原子或分子暴露于强短脉冲红外辐射时，电离以及“受抑隧道电离”（FTI）可能发生，其中一部分几乎电离的电子重新组合成初始基态或激发束缚态。我们分析的椭圆度依赖的相对信号，预测在一个单一的活性电子近似（SAE），其有效性是检查对一个无参数的多电子\hbox{$R$-matrix}（紧密耦合）与时间依赖性的方法。我们发现两个模型的结果之间有很好的一致性，从而提供了信心的SAE模型的潜力，以治疗感兴趣的过程。在我们的数值计算中发现的相对激发概率与Landsman { \it et al.}的预测的比较。(New Journal of Physics { \bf 15}（2013）013001）和Zhao { \it et al.}\（Optics Express { \bf 27}（2019）21689）揭示了与前者对于短脉冲的良好一致性。对于较长的脉冲，椭圆率依赖性变得比从Landsman { \it et al.}公式，但我们没有得到增加相比，线性偏振辐射预测赵{ \it等人}。

英文摘要：

When atoms or molecules are exposed to strong short-pulse infrared radiation, ionization as well as "frustrated tunneling ionization" (FTI) can occur, in which a portion of the almost ionized electrons recombine into the initial ground or an excited bound state. We analyze the ellipticity dependence of the relative signals that are predicted in a single-active electron approximation (SAE), the validity of which is checked against a parameter-free multi-electron \hbox{$R$-matrix} (close-coupling) with time dependence approach. We find good agreement between the results from both models, thereby providing confidence in the SAE model potential to treat the process of interest. Comparison of the relative excitation probabilities found in our numerical calculations with the predictions of Landsman {\it et al.}\ (New Journal of Physics {\bf 15} (2013) 013001) and Zhao {\it et al.}\ (Optics Express {\bf 27} (2019) 21689) reveals good agreement with the former for short pulses. For longer pulses, the ellipticity dependence becomes wider than that obtained from the Landsman {\it et al.} formula, but we do not obtain the increase compared to linearly polarized radiation predicted by Zhao {\it et al.}

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