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arXiv 2005.09044cond-mat.mtrl-sci
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半导体的可掺杂性及其对材料性能的控制

On the Dopability of Semiconductors and Governing Material Properties

Anuj Goyal, Prashun Gorai, Shashwat Anand, Eric S. Toberer, G. Jeffrey Snyder, Vladan Stevanovic

摘要:

为了实用,半导体需要掺杂。有时,接近简并能级,例如在热电、透明电子或电力电子等应用中。然而,许多具有有限带隙的材料根本不可掺杂,而许多其他材料表现出强烈的偏好,允许p型或n型掺杂,但不是两者都允许。在这项工作中,我们开发了一个模型描述的半导体掺杂和制定设计原则,在管理材料的性能。我们的方法,它建立在半导体缺陷理论应用到一个适当的设计(紧束缚)模型系统,揭示了内在的材料性能和半导体掺杂之间的分析关系,并阐明了以前建议的描述符,如绝对带边位置的作用和不足。我们验证了我们的模型对一些经典的二元半导体,并讨论其扩展到更复杂的化学和大规模的材料搜索的实用程序。

英文摘要:

To be practical, semiconductors need to be doped. Sometimes, to nearly degenerate levels, e.g. in applications such as thermoelectric, transparent electronics or power electronics. However, many materials with finite band gaps are not dopable at all, while many others exhibit strong preference toward allowing either p- or n-type doping, but not both. In this work, we develop a model description of semiconductor dopability and formulate design principles in terms of governing materials properties. Our approach, which builds upon the semiconductor defect theory applied to a suitably devised (tight-binding) model system, reveals analytic relationships between intrinsic materials properties and the semiconductor dopability, and elucidates the role and the insufficiency of previously suggested descriptors such as the absolute band edge positions. We validate our model against a number of classic binary semiconductors and discuss its extension to more complex chemistries and the utility in large-scale material searches.

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