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arXiv 2004.12827cond-mat.mtrl-sci
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高度无序材料的高分辨率应变测量

High resolution strain measurements in highly disordered materials

Mark Sutton, J. R. M. Lhermitte, F. Livet, F. Ehrburger-Dolle

摘要:

测量微小变形或应变的能力对于理解材料的许多方面都很有用。在这里,提出了一种新的散斑衍射峰的分析,其中散斑的系统移位进行分析,允许应变(或流动)图案被推断。这种斑点跟踪技术测量应变模式的精度类似于X射线单晶测量,但在无定形或高度无序的材料。

英文摘要:

The ability to measure small deformations or strains is useful for understanding many aspects of materials. Here, a new analysis of speckle diffraction peaks is presented in which the systematic shifts of the speckles are analyzed allowing for strain (or flow) patterns to be inferred. This speckle tracking technique measures strain patterns with a accuracy similar to x-ray single crystal measurements but in amorphous or highly disordered materials.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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