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arXiv 2003.05843quant-ph
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表面码泄漏错误的关键故障

Critical faults of leakage errors on the surface code

Natalie C. Brown, Andrew W. Cross, Kenneth R. Brown

摘要:

泄漏是当量子比特离开定义的计算子空间时发生的特别破坏性的错误。泄漏错误通过将额外的错误传播到其他量子比特并破坏伴随式测量来限制量子纠错码的有效性。泄漏误差对表面码的影响已经在各种情况下进行了研究。然而,泄漏的数据量子比特与泄漏的辅助量子比特的影响可能是完全不同的。在这里,我们分别研究了数据泄漏和辅助泄漏的影响。我们表明,数据泄露的破坏性要小得多。我们表明,表面码保持其距离的泄漏的存在下,无论是限制泄漏的数据量子位或消除aniclla量子位泄漏的关键故障位置。我们还介绍了新的技术,用于处理泄漏,通过使用门与单侧泄漏和混合两种类型的泄漏减少电路:一个处理数据泄漏和一个处理辅助泄漏。

英文摘要:

Leakage is a particularly damaging error that occurs when a qubit leaves the defined computational subspace. Leakage errors limit the effectiveness of quantum error correcting codes by spreading additional errors to other qubits and corrupting syndrome measurements. The effects of leakage errors on the surface code has been studied in various contexts. However, the effects of a leaked data qubit versus a leaked ancilla qubit can be quite different. Here, we study the effects of data leakage and ancilla leakage separately. We show that data leakage is much less damaging. We show that the surface code maintains its distance in the presence of leakage by either confining leakage to data qubits or eliminating aniclla qubit leakage at the critical fault location. We also introduce new techniques for handling leakage by using gates with one-sided leakage and by mixing two types of leakage reducing circuits: one to handle data leakage and one to handle ancilla leakage.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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