arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2002.11044eess.SPcs.LGstat.ML
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回归与深度学习用于传感器性能优化

Regression with Deep Learning for Sensor Performance Optimization

Boise State University(博伊西州立大学);ON Semiconductor(安森美半导体)

Ruthvik Vaila, Denver Lloyd, Kevin Tetz

摘要:

具有至少两个隐藏层的神经网络称为深度网络。人工智能和计算机编程的最新发展导致了Tensorflow,Keras,NumPy等工具的开发,使建模和从数据中得出结论变得更容易。在这项工作中,我们通过Keras和Tensorflow实现的深度学习重新处理非线性回归。特别是,我们使用深度学习来参数化工业传感器的输入和输出之间的非线性多变量关系,旨在基于选定的关键指标优化传感器性能。

英文摘要:

Neural networks with at least two hidden layers are called deep networks. Recent developments in AI and computer programming in general has led to development of tools such as Tensorflow, Keras, NumPy etc. making it easier to model and draw conclusions from data. In this work we re-approach non-linear regression with deep learning enabled by Keras and Tensorflow. In particular, we use deep learning to parametrize a non-linear multivariate relationship between inputs and outputs of an industrial sensor with an intent to optimize the sensor performance based on selected key metrics.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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