在先进光子源上用TESs测量硬X射线荧光
Hard X-ray Fluorescence measurements with TESs at the Advanced Photon Source
摘要：
用于硬X射线束线科学的过渡边缘传感器（TES）光谱仪将能够在信息丰富的2至20 keV能量范围内改进X射线发射和吸收光谱。我们正在为先进光子源（APS）同步加速器建立一个基于TES的仪器，以提供给光束线用户。24-最近已经制造并测试了像素原型阵列。使用这些阵列的第一次光谱测量是有希望的，最好的单像素能量分辨率为11.2 eV，饱和能量> 20 keV。我们提出了一系列最近的X射线荧光测量涉及过渡金属元素和多元素样品的发射线间隔很近，特别是一个Cu-Ni-Co薄膜和箔的Cu和Hf。TES测量的光谱直接比较与硅漂移探测器在APS光束线测量的光谱，证明了改进的X射线科学可能由TES光谱仪。
英文摘要：
Transition Edge Sensor (TES) spectrometers for hard X-ray beamline science will enable improved X-ray emission and absorption spectroscopy in the information-rich 2 to 20 keV energy range. We are building a TES-based instrument for the Advanced Photon Source (APS) synchrotron, to be made available to beamline users. 24-pixel prototype arrays have recently been fabricated and tested. The first spectroscopy measurements using these arrays are promising, with a best single-pixel energy resolution of 11.2 eV and saturation energy > 20 keV. We present a series of recent X-ray Fluorescence measurements involving transition metal elements and multi-element samples with closely spaced emission lines, in particular a Cu-Ni-Co thin film and a foil of Cu and Hf. The TES-measured spectra are directly compared to spectra measured with silicon drift detectors at an APS beamline, demonstrating the improved X-ray science made possible by TES spectrometers.
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