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arXiv 1809.02602cond-mat.str-el
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NiS $_{2-x}$ Se $_x$化合物中绝缘体-金属转变的结构研究

Structural investigation of the insulator-metal transition in NiS$_{2-x}$Se$_x$ compounds

Garam Han, Sungkyun Choi, Hwanbeom Cho, Byungmin Sohn, Je-Geun Park, Changyoung Kim

摘要:

我们报告的组合测量的高分辨率X射线衍射粉末和拉曼散射单晶NiS 2-xSex样品,表现出绝缘体-金属过渡与硒掺杂。通过X射线,在过渡温度下观察到Ni和S(Se)离子之间的键长的突然变化,与硫族元素离子之间几乎恒定的键长形成鲜明对比。拉曼散射是一种对硫属元素键振动具有独特灵敏度的互补技术,其声子谱没有发现异常,与X射线衍射结果一致。这表明Ni和S(Se)之间的相互作用在绝缘体-金属转变中的重要作用。这种解释的潜在影响进行了讨论,在目前的理论模型。

英文摘要:

We report on a combined measurement of high-resolution x-ray diffraction on powder and Raman scattering on single crystalline NiS2-xSex samples that exhibit the insulator-metal transition with Se doping. Via x-rays, an abrupt change in the bond length between Ni and S (Se) ions was observed at the transition temperature, in sharp contrast to the almost constant bond length between chalcogen ions. Raman scattering, a complementary technique with the unique sensitivity to the vibrations of chalcogen bonds, revealed no anomalies in the phonon spectrum, consistent with the x-ray diffraction results. This indicates the important role of the interaction between Ni and S (Se) in the insulator-metal transition. The potential implication of this interpretation is discussed in terms of current theoretical models.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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