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arXiv 1807.08282cond-mat.mes-hall
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作为人工半导体的半导体范德华界面

Semiconducting van der Waals Interfaces as Artificial Semiconductors

Evgeniy Ponomarev, Nicolas Ubrig, Ignacio Gutiérrez-Lezama, Helmuth Berger, Alberto F. Morpurgo

摘要:

最近的技术进展表明,将范德华键合化合物的原子级薄晶体的几乎任何组合堆叠在一起以形成新型异质结构和界面的可能性。因此,需要在定量水平上理解界面性质如何由组成2D材料的性质决定。我们通过研究基于过渡金属二硫属化物单分子膜的两种不同界面的传输和光电响应来解决这个问题,即WSe 2-MoSe 2和WSe 2-MoS 2。通过利用离子液体门控晶体管的光谱能力,我们展示了如何的传导和价带的各个单层确定的带的接口,我们建立定量(直接从测量)的能量对齐的带在不同的材料以及界面带隙的大小。光致发光和光电流测量使我们得出结论,WSe 2-MoSe 2界面的带隙是直接在k空间,而WSe 2/MoS 2的间隙是间接的。对于WSe 2/MoSe 2,我们检测层间激子的衰变发出的光,并使用从传输测量中提取的界面带隙的值通过实验确定它们的结合能。我们得出这一结论所采用的技术证明了一种相当通用的策略,可以根据组成原子层的性质定量表征界面性质。这里呈现的结果进一步说明了两种不同的2D半导体材料的范德华界面是如何成为真正表现为人工半导体的复合系统的,其性质可以通过选择适当的组成半导体单层来确定性地定义。

英文摘要:

Recent technical progress demonstrates the possibility of stacking together virtually any combination of atomically thin crystals of van der Waals bonded compounds to form new types of heterostructures and interfaces. As a result, there is the need to understand at a quantitative level how the interfacial properties are determined by the properties of the constituent 2D materials. We address this problem by studying the transport and optoelectronic response of two different interfaces based on transition-metal dichalcogenide monolayers, namely WSe2-MoSe2 and WSe2-MoS2. By exploiting the spectroscopic capabilities of ionic liquid gated transistors, we show how the conduction and valence bands of the individual monolayers determine the bands of the interface, and we establish quantitatively (directly from the measurements) the energetic alignment of the bands in the different materials as well as the magnitude of the interfacial band gap. Photoluminescence and photocurrent measurements allow us to conclude that the band gap of the WSe2-MoSe2 interface is direct in k space, whereas the gap of WSe2/MoS2 is indirect. For WSe2/MoSe2, we detect the light emitted from the decay of interlayer excitons and determine experimentally their binding energy using the values of the interfacial band gap extracted from transport measurements. The technique that we employed to reach this conclusion demonstrates a rather-general strategy for characterizing quantitatively the interfacial properties in terms of the properties of the constituent atomic layers. The results presented here further illustrate how van der Waals interfaces of two distinct 2D semiconducting materials are composite systems that truly behave as artificial semiconductors, the properties of which can be deterministically defined by the selection of the appropriate constituent semiconducting monolayers.

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