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arXiv 1802.09500cond-mat.stat-mech
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径向限制的固体-固体和腐蚀界面生长模型

Radial Restricted Solid-on-Solid and Etching Interface Growth Models

Sidiney G. Alves

摘要:

在这项工作中,提出了一种方法来生成径向接口。一个径向网络递归获得的是用来实现离散的模型规则,最初设计的调查在平面基板。为了测试所提出的方案,我们已经使用了限制固体对固体和蚀刻模型。结果表明KPZ猜想得到了充分的验证。此外,界面半径起伏分布与GUE分布之间有很好的一致性。两点关联函数与Airy $_2$过程的协方差具有很好的一致性.因此,该方法也可用于研究其他普适类的径向界面演化。

英文摘要:

In this work, an approach to generate radial interfaces is presented. A radial network recursively obtained is used to implement discrete model rules designed originally for the investigation in flat substrates. In order to test the proposed scheme, we have used the restricted solid-on-solid and etching models. The results indicate the KPZ conjecture is fully verified. Besides, a very good agreement between the interface radius fluctuation distribution and the GUE one was observed. The evolution of the radius agrees very well with the generalized conjecture, and the two-point correlation function exhibits a very good agreement with the covariance of Airy$_2$ process. So, this approach can be used to investigate radial interfaces evolution for others universality classes.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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