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arXiv 1802.01964cond-mat.mtrl-sci
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(100)Si上反应溅射DC非晶薄膜热退火制备纳米晶d-MoN

Synthesis of nanocrystalline d-MoN by thermal annealing of amorphous thin films grown on (100) Si by reactive DC sputtering at room temperature

N. Haberkorn, S. Bengio, H. Troiani, S. Suárez, P. D. Pérez, M. Sirena, J. Guimpel

摘要:

本文报道了用反应溅射法在(100)Si衬底上生长非晶薄膜,并在室温下晶化得到纳米晶δ-MoN。使用5毫托的沉积压力和Ar/(Ar+N2)=0.5的反应混合物生长具有化学组成MoN的膜。所生长的薄膜显示主要是非晶结构。在高于600 °C的温度下退火后获得纳米晶δ-MoN相。超导临界温度Tc取决于薄膜厚度。在700 °C下退火30分钟的厚膜(170 nm)显示Tc = 11.2 K(接近于体样品所报道的Tc:13 K),对于40 nm厚的δ-MoN膜,其逐渐被抑制到7.2 K。我们的研究结果提供了一个简单的方法来合成超导氮化物薄膜在硅晶片上的Tc以上的传统超导体,如Nb。

英文摘要:

We report on the synthesis and characterization of nanocrystalline delta-MoN by crystallization of amorphous thin films grown on (100) Si by reactive sputtering at room temperature. Films with chemical composition MoN were grown using a deposition pressure of 5mTorr with a reactive mixture of Ar/(Ar+N2)=0.5. The as-grown films display mostly amorphous structure. Nanocrystalline delta-MoN phase is obtained after annealing at temperatures above 600 °C. The superconducting critical temperature Tc depends on film thickness. Thick films (170 nm) annealed at 700 °C for 30 min display a Tc = 11.2 K (close to the one reported for bulk specimens: 13 K), which is gradually suppressed to 7.2 K for 40 nm thick delta-MoN films. Our results provide a simple method to synthesize superconducting nitride thin films on silicon wafers with Tc above the ones observed for conventional superconductors such as Nb.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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