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arXiv 1802.01552cond-mat.mtrl-sci
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MoTe2中本征缺陷和电子辐照诱导缺陷的原子结构

Atomic structure of intrinsic and electron-irradiation-induced defects in MoTe2

Kenan Elibol, Toma Susi, Giacomo Argentero, Mohammad Reza Ahmadpour Monazam, Timothy John Pennycook, Jannik C. Meyer, Jani Kotakoski

摘要:

二维过渡金属二硫属化合物中本征缺陷的原子结构在透射电子显微镜(TEM)中很难研究,因为它们在强电子辐照下会迅速损伤。然而,这也可以导致对缺陷的产生及其原子尺度动力学的洞察。我们首先表明,MoTe 2单分子膜没有保护确实迅速降解扫描TEM(STEM)成像过程中,并讨论观察到的原子级动力学,包括从1H相到1T ',三重旋转对称缺陷的转变,和两个1H晶粒之间的线缺陷的迁移与60°取向差。然后,我们分析了封装在两个石墨烯片之间的MoTe 2的原子结构,以减轻损伤,发现所制备的材料含有意想不到的大浓度缺陷。这些缺陷包括与在未封装材料中产生的缺陷类似的点缺陷(或量子点,QD),以及两种不同类型的线缺陷(或量子线,QW),其可以在电子照射下从一种转变为另一种。我们的密度泛函理论模拟表明,量子点和量子阱嵌入MoTe 2引入新的中间带隙状态的半导体材料,因此可以用来控制其电子和光学性质。最后,封装材料的边缘呈现无定形,这可能是由于封装引起的压力。

英文摘要:

Studying the atomic structure of intrinsic defects in two-dimensional transition metal dichalcogenides is difficult since they damage quickly under the intense electron irradiation in transmission electron microscopy (TEM). However, this can also lead to insights into the creation of defects and their atom-scale dynamics. We first show that MoTe 2 monolayers without protection indeed quickly degrade during scanning TEM (STEM) imaging, and discuss the observed atomic-level dynamics, including a transformation from the 1H phase into 1T', three-fold rotationally symmetric defects, and the migration of line defects between two 1H grains with a 60° misorientation. We then analyze the atomic structure of MoTe2 encapsulated between two graphene sheets to mitigate damage, finding the as-prepared material to contain an unexpectedly large concentration of defects. These include similar point defects (or quantum dots, QDs) as those created in the non-encapsulated material, and two different types of line defects (or quantum wires, QWs) that can be transformed from one to the other under electron irradiation. Our density functional theory simulations indicate that the QDs and QWs embedded in MoTe2 introduce new midgap states into the semiconducting material, and may thus be used to control its electronic and optical properties. Finally, the edge of the encapsulated material appears amorphous, possibly due to the pressure caused by the encapsulation.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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