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arXiv 1712.00532cond-mat.mtrl-sci
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半导体层状Bi2O2Se的本征点缺陷

Native point defects of semiconducting layered Bi2O2Se

Huanglong Li, Xintong Xu, Yi Zhang, Roland Gillen, Luping Shi, John Robertson

摘要:

Bi 2 O2 Se是一种新兴的半导体、空气稳定的层状材料(Nat.Nanotechnol. 2017,12,530; Nano Lett. 2017,17,3021),在电子迁移率方面可能超过MoS 2和磷烯,并在下一代高速和低功率电子器件中与典型的范德华堆叠层状材料相媲美。它具有功能多样性的承诺,引起了包括光电子学、热电子学和压电学在内的各个学科的迅速增长的兴趣。在这项工作中,我们全面研究了Bi 2 O2 Se中的本征点缺陷的电学性质,作为理解这种材料的基本原理的重要一步。研究了缺陷形貌与费米能和原子组分化学势的关系。随着体缺陷分析,表面性质的补充检查,在电荷中性水平模型的简单背景下,阐明了所观察到的n型特性的Bi 2 O2 Se基FET。这项工作提供了重要的指导,工程缺陷的Bi 2 O2 Se所需的性能,这是成功应用的关键,这种新兴的层状材料。

英文摘要:

Bi2O2Se is an emerging semiconducting, air-stable layered material (Nat. Nanotechnol. 2017, 12, 530; Nano Lett. 2017, 17, 3021), potentially exceeding MoS2 and phosphorene in electron mobility and rivalling typical Van der Waals stacked layered materials in the next-generation high-speed and low-power electronics. Holding the promise of functional versatility, it is arousing rapidly growing interest from various disciplines, including optoelectronics, thermoelectronics and piezoelectronics. In this work, we comprehensively study the electrical properties of the native point defects in Bi2O2Se, as an essential step toward understanding the fundamentals of this material. The defect landscapes dependent on both Fermi energy and the chemical potentials of atomic constituents are investigated. Along with the bulk defect analysis, a complementary inspection of the surface properties, within the simple context of charge neutrality level model, elucidates the observed n-type characteristics of Bi2O2Se based FETs. This work provides important guide to engineer the defects of Bi2O2Se for desired properties, which is key to the successful application of this emerging layered material.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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