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arXiv 1704.00533physics.opticsquant-ph
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光子Floquet拓扑绝缘体中的动态缺陷

Dynamic defects in photonic Floquet topological insulators

Christina Jörg, Fabian Letscher, Michael Fleischhauer, Georg von Freymann

摘要:

已知拓扑绝缘体中的边缘模式对缺陷是鲁棒的。我们调查,如果这也成立时,缺陷是不是静态的,但随时间变化。我们研究的缺陷与时间相关的耦合的鲁棒性的传输沿边缘的螺旋弯曲波导的Floquet系统的影响。波导阵列是通过在负性光致抗蚀剂中直接激光写入来制造的。我们发现,单一的动态缺陷不破坏手征边缘电流,即使时间调制很强。体波导和边缘波导中的强度的定量数值模拟证实了我们的观察。

英文摘要:

Edge modes in topological insulators are known to be robust against defects. We investigate if this also holds true when the defect is not static, but varies in time. We study the influence of defects with time-dependent coupling on the robustness of the transport along the edge in a Floquet system of helically curved waveguides. Waveguide arrays are fabricated via direct laser writing in a negative tone photoresist. We find that single dynamic defects do not destroy the chiral edge current, even when the temporal modulation is strong. Quantitative numerical simulation of the intensity in the bulk and edge waveguides confirms our observation.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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