arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1702.04692physics.optics
收藏

透明物体的双视场显微术:光线追迹法

Bright-field microscopy of transparent objects: a ray tracing approach

A. K. Khitrin, M. A. Model

摘要:

本文用基本几何光学描述透明位相物体的明场显微像的形成。我们的方法是基于这样的前提下,图像复制的强度分布(真实或虚拟)在物镜的前焦平面。因此,任务减少到找到由物体引起的焦平面处的强度变化。这可以通过补充有光线数量守恒要求的光线跟踪来完成。尽管这种分析涉及重大简化,但它再现了近轴波理论的一些结果。此外,我们的分析提出了两种方法从亮场图像中提取定量相位信息:通过垂直移动焦平面(强度传输分析中使用的方法)或通过改变照明角度。原则上,这样获得的信息应该允许对象形态的重建。

英文摘要:

Formation of a bright-field microscopic image of a transparent phase object is described in terms of elementary geometrical optics. Our approach is based on the premise that image replicates the intensity distribution (real or virtual) at the front focal plane of the objective. The task is therefore reduced to finding the change in intensity at the focal plane caused by the object. This can be done by ray tracing complemented with the requirement of conservation of the number of rays. Despite major simplifications involved in such an analysis, it reproduces some results from the paraxial wave theory. Additionally, our analysis suggests two ways of extracting quantitative phase information from bright-field images: by vertically shifting the focal plane (the approach used in the transport-of-intensity analysis) or by varying the angle of illumination. In principle, information thus obtained should allow reconstruction of the object morphology.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑