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arXiv 1702.01065cond-mat.mtrl-sci
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电沉积Co/Cu多层膜的巨磁电阻和结构:层厚和Cu沉积电位的影响

Giant magnetoresistance and structure of electrodeposited Co/Cu multilayers: the influence of layer thicknesses and Cu deposition potential

N. Rajasekaran, J. Mani, B. G. Tóth, G. Molnár, S. Mohan, L. Péter, I. Bakonyi

摘要:

采用恒电流/恒电位脉冲法在纯硫酸盐电解液中制备了Co/Cu多层膜,研究了不同膜厚、多层膜总厚度和Cu沉积电位对多层膜巨磁电阻(GMR)和结构的影响。X射线衍射(XRD)测量显示,超晶格卫星反射的许多多层具有足够大的厚度(至少2纳米)的两个组成层。由可见超晶格反射位置得到的双层重复数通常比标称值高10-20%,即使对于没有可见超晶格卫星的多层膜,观察到的巨磁电阻也由多层铁磁(FM)贡献主导。也总是有一个温和的超顺磁性(SPM)的GMR的贡献,这一项是最大的多层膜非常薄(0.5纳米)的磁性层显然含有少量的磁去耦SPM区域。在任何磁性层厚度下,均未观察到GMR随间隔层厚度的振荡行为。通过MR(H)曲线的峰值位置测量的磁饱和度的饱和度指示对于大间隔物厚度的磁性层的完全解耦。GMR随多层膜总厚度的增加而增加,这可以归因于由于增加的表面粗糙度而增加的SPM对GMR的贡献,也由增加的折射率表示。对于多层膜与铜层沉积在越来越多的正电位,GMRFM项增加和GMRSPM项减少。同时,用原子力显微镜测量的表面粗糙度的相应减少表明多层结构质量的改善,然而,并不伴随着超晶格反射强度的增加。

英文摘要:

The giant magnetoresistance (GMR) and structure was investigated for electrodeposited Co/Cu multilayers prepared by a conventional galvanostatic/potentiostatic pulse combination from a pure sulfate electrolyte with various layer thicknesses, total multilayer thickness and Cu deposition potential. X-ray diffraction (XRD) measurements revealed superlattice satellite reflections for many of the multilayers having sufficiently large thickness (at least 2 nm) of both constituent layers. The bilayer repeats derived from the positions of the visible superlattice reflections were typically 10-20% higher than the nominal values.The observed GMR was found to be dominated by the multilayer-like ferromagnetic (FM) contribution even for multilayers without visible superlattice satellites. There was always also a modest superparamagnetic (SPM) contribution to the GMR and this term was the largest for multilayers with very thin (0.5 nm) magnetic layers containg apparently a small amount of magnetically decoupled SPM regions. No oscillatory GMR behavior with spacer thickness was observed at any magnetic layer thickness. The saturation of the coercivity as measured by the peak position of the MR(H) curves indicated a complete decoupling of magnetic layers for large spacer thicknesses. The GMR increased with total multilayer thickness which could be ascribed to an increasing SPM contribution to the GMR due to an increasing surface roughness, also indicated by the increasing coercivity. For multilayers with Cu layers deposited at more and more positive potentials, the GMRFM term increased and the GMRSPM term decreased. At the same time, a corresponding reduction of surface roughness measured with atomic force microscopy indicated an improvement of the multilayer structural quality which was, however, not accompanied by an increase of the superlattice reflection intensities.

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