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arXiv 1609.09208cond-mat.mes-hallcond-mat.mtrl-sciquant-ph
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石墨烯中电流的量子成像

Quantum imaging of current flow in graphene

Jean-Philippe Tetienne, Nikolai Dontschuk, David A. Broadway, Alastair Stacey, David A. Simpson, Lloyd C. L. Hollenberg

摘要:

自2004年首次分离以来,石墨烯已被发现拥有大量不寻常的电子传输现象,使其成为凝聚态物理基础研究的迷人系统,并为未来的电子和传感设备提供了巨大的机会。然而,为了完全实现这些目标,一个主要的挑战是在单层石墨烯结构和器件中非侵入性成像电荷电流的能力。通常,石墨烯中的电子输运已经通过电阻率测量进行了研究,然而,这种测量通常对观察和研究地标输运现象至关重要的空间信息是盲目的,例如电子引导和聚焦,拓扑电流和真实空间中的粘性电子回流,以及现实的不完美器件。在这里,我们将量子成像应用于这个问题,并展示了石墨烯结构中电流的高分辨率成像。我们的方法利用金刚石中的近表面原子大小的量子传感器的工程阵列来映射矢量磁场,并在不同复杂性的石墨烯几何结构上重建矢量电流密度,从单带到结,具有衍射极限的空间分辨率和对小至1 μA的电流的投影灵敏度。测得的电流图显示出强烈的空间变化,对应于亚微米尺度的物理缺陷。所展示的方法开辟了一个重要的新途径,研究基本的电子和自旋输运在石墨烯结构和设备,更普遍的是在新兴的二维材料和薄膜系统。

英文摘要:

Since its first isolation in 2004, graphene has been found to host a plethora of unusual electronic transport phenomena, making it a fascinating system for fundamental studies in condensed-matter physics as well as offering tremendous opportunities for future electronic and sensing devices. However, to fully realise these goals a major challenge is the ability to non-invasively image charge currents in monolayer graphene structures and devices. Typically, electronic transport in graphene has been investigated via resistivity measurements, however, such measurements are generally blind to spatial information critical to observing and studying landmark transport phenomena such as electron guiding and focusing, topological currents and viscous electron backflow in real space, and in realistic imperfect devices. Here we bring quantum imaging to bear on the problem and demonstrate high-resolution imaging of current flow in graphene structures. Our method utilises an engineered array of near-surface, atomic-sized quantum sensors in diamond, to map the vector magnetic field and reconstruct the vector current density over graphene geometries of varying complexity, from mono-ribbons to junctions, with spatial resolution at the diffraction limit and a projected sensitivity to currents as small as 1 μA. The measured current maps reveal strong spatial variations corresponding to physical defects at the sub-μm scale. The demonstrated method opens up an important new avenue to investigate fundamental electronic and spin transport in graphene structures and devices, and more generally in emerging two-dimensional materials and thin film systems.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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