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arXiv 1608.02248cond-mat.mes-hall
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石墨烯磁聚焦探针扫描图像分析

Analysis of Scanned Probe Images for Magnetic Focusing in Graphene

Sagar Bhandari, Gil-Ho Lee, Philip Kim, Robert M. Westervelt

摘要:

我们使用一个冷却的扫描探针显微镜(SPM)来研究纳米器件中的电子运动。当测量装置的电导时,SPM的带电尖端在表面上方的恒定高度处被光栅扫描。图像电荷散射电子,改变电子通过样品的路径。1 -3使用这种技术,我们对在磁聚焦状态下在两个窄触点之间流动的弹道hBN-石墨烯-hBN器件的回旋轨道3进行了成像。在这里,我们提出了一个分析我们的磁聚焦成像结果的基础上产生的尖端电荷密度下降的弹道电子的运动的影响。密度下降局部地降低了费米能量,产生了一种将电子推离尖端的力。当尖端位于回旋加速器轨道上方时,电子被偏转远离接收触点,通过减少触点之间的传输来创建图像。数据和我们的分析表明,石墨烯的边缘是相当粗糙的,电子散射的边缘反弹在随机的方向。然而,当尖端靠近边缘时,它可以通过将电子从边缘反弹向接收触点来增强传输。我们的研究结果表明,一个冷却SPM是一个很有前途的工具,调查弹道石墨烯设备中的电子运动。

英文摘要:

We use a cooled Scanning Probe Microscope (SPM) to electron motion in nanoscale devices. The charged tip of the SPM is raster scanned at a constant height above the surface as the conductance of the device is measured. The image charge scatters electrons away, changing the path of electrons through the sample.1-3 Using this technique, we have imaged cyclotron orbits3 for ballistic hBN-graphene-hBN devices that flow between two narrow contacts in the magnetic focusing regime. Here we present an analysis of our magnetic focusing imaging results based on the effects of the tip-created charge density dip on the motion of ballistic electrons. The density dip locally reduces the Fermi energy, creating a force that pushes electrons away from the tip. When the tip is above the cyclotron orbit, electrons are deflected away from the receiving contact, creating an image by reducing the transmission between contacts. The data and our analysis suggest that graphene edge is rather rough, and electrons scattering off the edge bounce in random directions. However, when the tip is close to the edge it can enhance transmission by bouncing electrons away from the edge, toward the receiving contact. Our results demonstrate that a cooled SPM is a promising tool to investigate the motion of electrons in ballistic graphene devices.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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