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arXiv 1608.01045cond-mat.mtrl-sci
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混合价态YbAl3薄膜的外延生长和电子性质

Epitaxial growth and electronic properties of mixed valence YbAl3 thin films

Shouvik Chatterjee, Suk Hyun Sung, David J. Baek, Lena F. Kourkoutis, Darrell G. Schlom, Kyle M. Shen

摘要:

本文报道了用分子束外延法在MgO上生长混合价化合物YbAl $_{3}$的薄膜。采用铝缓冲层,外延(001)薄膜可以生长亚纳米的表面粗糙度。使用X-射线衍射,原位低能电子衍射和像差校正的扫描透射电子显微镜,我们建立的薄膜是有序的,在体以及在表面。我们的电影表现出的相干温度为37 K,可比报告的散装单晶。光电子能谱学揭示了$\textit{f}^{13}$和$\textit{f}^{12}$最终状态的贡献,确立了YbAl $_{3}$是一种混合价化合物,并显示了费米能级附近的近藤共振峰的存在。

英文摘要:

We report the growth of thin films of the mixed valence compound YbAl$_{3}$ on MgO using molecular-beam epitaxy. Employing an aluminum buffer layer, epitaxial (001) films can be grown with sub-nm surface roughness. Using x-ray diffraction, in situ low-energy electron diffraction and aberration-corrected scanning transmission electron microscopy we establish that the films are ordered in the bulk as well as at the surface. Our films show a coherence temperature of 37 K, comparable to that reported for bulk single crystals. Photoelectron spectroscopy reveals contributions from both $\textit{f}^{13}$ and $\textit{f}^{12}$ final states establishing that YbAl$_{3}$ is a mixed valence compound and shows the presence of a Kondo Resonance peak near the Fermi-level.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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