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arXiv 1605.03465cond-mat.mes-hall

Influence of disordered edges on transport properties in graphene

D. Smirnov, G. Yu. Vasileva, J. C. Rode, C. Belke, Yu. B. Vasilyev, Yu. L. Ivanov, R. J. Haug

英文摘要:

The influence of plasma etched sample edges on electrical transport and doping is studied. Through electrical transport measurements the overall doping and mobility are analyzed for mono- and bilayer graphene samples. As a result the edge contributes strongly to the overall doping of the samples. Furthermore the edge disorder can be found as the main limiting source of the mobility for narrow samples.

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