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arXiv 1602.07524cond-mat.mes-hall
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作为经典记忆效应的微波诱导电阻振荡

Microwave-induced resistance oscillations as a classical memory effect

Y. M. Beltukov, M. I. Dyakonov

摘要:

通过数值模拟和分析研究,我们发现微波诱导电阻振荡现象可以理解为电子在回旋加速器周期后与散射中心再碰撞所引起的经典记忆效应。我们开发了一个类似德鲁德的方法,磁输运在微波场的存在下,考虑到记忆效应,并找到一个很好的协议之间的数值和分析结果,以及与实验的定性协议。

英文摘要:

By numerical simulations and analytical studies, we show that the phenomenon of microwave-induced resistance oscillations can be understood as a classical memory effect caused by re-collisions of electrons with scattering centers after a cyclotron period. We develop a Drude-like approach to magneto-transport in presence of a microwave field, taking account of memory effects, and find an excellent agreement between numerical and analytical results, as well as a qualitative agreement with experiment.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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