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arXiv 1503.02373cs.SIcs.CYcs.DLphysics.soc-ph
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专利地图的技术距离测量

Measuring Technological Distance for Patent Mapping

Bowen Yan, Jianxi Luo

摘要:

近年来,在情报学文献中,出现了利用专利数据库和专利分类信息构建技术领域网络图的事例,其目的在于帮助竞争情报分析和创新决策。构建这样一个专利网络,需要对专利分类系统中不同类别专利之间的距离进行适当的测量。尽管文献中存在各种距离测量方法,但尚不清楚如何一致地评估和比较它们,以及选择哪些方法来构建专利技术网络地图。这种模糊性限制了这种技术地图的发展和应用。在这里,我们建议比较替代的距离测量,并通过分析所产生的专利网络地图的结构特性的差异和相似性,确定优越的。利用1976 - 2006年美国专利数据和国际专利分类系统,我们比较了12个有代表性的距离度量,这些度量量化了领域间知识库的接近度、创新主体的跨领域多样化可能性或频率以及专利类别在同一专利中的共现。比较分析表明,基于规范化共指和发明人多样化似然测度的专利技术网络图具有较好的代表性。

英文摘要:

Recent works in the information science literature have presented cases of using patent databases and patent classification information to construct network maps of technology fields, which aim to aid in competitive intelligence analysis and innovation decision making. Constructing such a patent network requires a proper measure of the distance between different classes of patents in the patent classification systems. Despite the existence of various distance measures in the literature, it is unclear how to consistently assess and compare them, and which ones to select for constructing patent technology network maps. This ambiguity has limited the development and applications of such technology maps. Herein, we propose to compare alternative distance measures and identify the superior ones by analyzing the differences and similarities in the structural properties of resulting patent network maps. Using United States patent data from 1976 to 2006 and International Patent Classification system, we compare 12 representative distance measures, which quantify inter-field knowledge base proximity, field-crossing diversification likelihood or frequency of innovation agents, and co-occurrences of patent classes in the same patents. Our comparative analyses suggest the patent technology network maps based on normalized co-reference and inventor diversification likelihood measures are the best representatives.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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