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arXiv 1502.02703physics.acc-phphysics.ins-det
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Third generation residual gas ionization profile monitors at Fermilab

J. R. Zagel, M. Alvarez, B. Fellenz, C. Jensen, C. Lundberg, E. McCrory, D. Slimmer, R. Thurman-Keup, D. Tinsley

英文摘要:

The latest generation of IPMs installed in the Fermilab Main Injector and Recycler incorporate a 1 kG permanent magnet, a newly designed high-gain, rad-tolerant preamp, and a control grid to moderate the charge that is allowed to arrive on the anode pick-up strips. The control grid is intended to select a single Booster batch measurement per turn. Initially it is being used to allow for a faster turn-on of a single, high-intensity cycle in either machine. The expectation is that this will extend the Micro Channel Plate lifetime, which is the high-cost consumable in the measurement system. We discuss the new design and data acquired with this system.

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