发表机构
Fermi National Accelerator Laboratory; Illinois Institute of Technology; Northern Illinois University（费米国家加速器实验室; 伊利诺伊理工学院; 北伊利诺伊大学）
机构由 AI 辅助整理，请以论文原文为准。AI 中文总结
本文介绍了费米实验室IOTA储存环中一对新型电离剖面监测器的设计，采用离子收集、双微通道板和校准泄漏增压，以在2.5 MeV质子束下实现非破坏性剖面测量。
AI 中文摘要
电离剖面监测器（IPM）在世界各地的许多加速器实验室中被用于高能粒子束的非破坏性剖面测量。它们已被用于费米实验室建造的几乎所有同步加速器中，目前用于主注入器（MI）、回收环（RR）和助推器。本文将介绍即将安装在可积光学测试加速器（IOTA）中的一对新型IPM的设计现状，IOTA是一个束流能量为2.5 MeV的实验性质子储存环。该设计融合了费米实验室先前或目前使用的几种IPM的特点。与助推器IPM类似，它收集离子而非电子，因此无需外部磁场。为了增加信号，每个IPM采用两块微通道板以人字形配置，如同MI/RR IPM所做的那样；并且由于环的超高真空条件，通过校准泄漏提高局部真空压力，类似于以前的Tevatron IPM，以增加每束团的电离产额。数据采集包括升级的前置放大器，并利用了IOTA已在使用的束流位置监测系统的数字化仪设计。除了机械和电子设计外，还将介绍电场和注入气体对循环束流影响的模拟结果。
英文摘要
Ionization profile monitors (IPM) are used in many accelerator laboratories around the world for non-destructive profile measurements of high-energy particle beams. They have been used in nearly all the synchrotrons built at Fermilab and are presently used in the Main Injector (MI), Recycler (RR), and Booster. This paper will present the current status of the design of a new pair of IPMs to be installed in the Integrable Optics Test Accelerator (IOTA), an experimental proton storage ring with a beam energy of 2.5 MeV. The design incorporates aspects of several IPMs previously or currently used at FNAL. Similar to the Booster IPM, ions are collected rather than electrons, thus requiring no external magnetic field. To increase the signal, each IPM uses two microchannel plates in the chevron configuration as is done in the MI/RR IPMs, and due to the ring's ultrahigh vacuum conditions, the local vacuum pressure is increased with a calibrated leak, akin to the former Tevatron IPMs, to increase the ionization yield per bunch. Data acquisition includes upgraded preamplifiers and leveraging of the digitizer design of the beam position monitor system already in use at IOTA. In addition to the mechanical and electronic designs, simulation results of the effects of the electric fields and injected gas on the circulating beam will also be presented.
Comments15th International Beam Instrumentation Conference (IBIC2026)
