arXivDaily arXiv每日学术速递 周一至周五更新
arXiv周末暂无论文更新,休息一下吧,周末愉快~~
arXiv 1409.0185physics.opticscond-mat.mes-hallcond-mat.mtrl-sciphysics.ins-det
收藏

利用光学力绘制纳米尺度电磁近场分布

Mapping Nanoscale Electromagnetic Near-Field Distributions Using Optical Forces

Fei Huang, Venkata Ananth Tamma, Zahra Mardy, Jonathan Burdett, H. Kumar Wickramasinghe

摘要:

我们展示了应用原子力显微镜(AFM)为基础的光学力显微镜映射的光学近场与纳米分辨率,仅限于AFM探针的几何形状。我们映射的电场分布的紧密聚焦的激光束与不同的偏振,并表明,实验测量的数据与理论预测的偶极-偶极相互作用模型,从而验证了我们的方法。我们进一步验证了所提出的技术,通过测量纳米颗粒和金涂层AFM探针之间的光学力来评估由球形纳米颗粒散射的光学电场。该技术允许波长无关,无背景,热噪声限制的光学现象的机械成像,灵敏度受AFM性能限制。由于电和磁偶极-偶极相互作用的光学力可以使用这种技术测量。

英文摘要:

We demonstrate the application of Atomic Force Microscopy (AFM) based optical force microscopy to map the optical near-fields with nanometer resolution, limited only by the AFM probe geometry. We map the electric field distributions of tightly focused laser beams with different polarizations and show that the experimentally measured data agrees well with the theoretical predictions from a dipole-dipole interaction model, thereby validating our approach. We further validate the proposed technique by evaluating the optical electric field scattered by a spherical nanoparticle by measuring the optical forces between the nanoparticle and gold coated AFM probe. The technique allows for wavelength independent, background free, thermal noise limited mechanical imaging of optical phenomenon with sensitivity limited by AFM performance. Optical forces due to both electric and magnetic dipole-dipole interactions can be measured using this technique.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑