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arXiv 1402.0259cond-mat.mes-hall
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基于场效应晶体管的高强度太赫兹探测器研究

High intensity study of THz detectors based on field effect transistors

Dmytro B. But, Christoph Drexler, Mykola V. Sakhno, Nina Dyakonova, Oleksiy Drachenko, Alexey Gutin, Fiodor F. Sizov, Sergey D. Ganichev, Wojciech Knap

摘要:

对于Si金属氧化物半导体场效应晶体管和InGaAs高电子迁移率晶体管,研究了在0.1 ~ 3 THz的频率下,入射辐射功率密度高达100 kW/cm^2时,场效应晶体管光响应的太赫兹功率依赖性。在kW/cm ^2范围内,光响应随辐射功率的增加而线性增加。对于所有研究的场效应晶体管,当光强超过几kW/cm ^2时,都观察到光响应饱和。所观察到的信号饱和解释漏光电流饱和类似的直流输出特性的饱和。建立了太赫兹场效应晶体管高强度光响应的理论模型。该模型定量地解释了线性和非线性(饱和)范围内的实验数据。我们的结果表明,场效应晶体管的动态范围很高,可以扩展到六个数量级以上的功率密度(从0.5 mW/cm ^2到5 kW/cm ^2)。

英文摘要:

Terahertz power dependence of the photoresponse of field effect transistors, operating at frequencies from 0.1 to 3 THz for incident radiation power density up to 100 kW/cm^2 was studied for Si metal-oxide-semiconductor field-effect transistors and InGaAs high electron mobility transistors. The photoresponse increased linearly with increasing radiation power up to kW/cm^2 range. The saturation of the photoresponse was observed for all investigated field effect transistors for intensities above several kW/cm^2. The observed signal saturation is explained by drain photocurrent saturation similar to saturation in direct currents output characteristics. The theoretical model of terahertz field effect transistor photoresponse at high intensity was developed. The model explains quantitatively experimental data both in linear and nonlinear (saturation) range. Our results show that dynamic range of field effect transistors is very high and can extend over more than six orderd of magnitudes of power densities (from 0.5 mW/cm^2 to 5 kW/cm^2).

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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