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arXiv 1306.6639cond-mat.mes-hall
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高偏压下原子尺度Au断裂结的噪声增强

Enhanced noise at high bias in atomic-scale Au break junctions

Ruoyu Chen, Patrick J. Wheeler, M. Di Ventra, D. Natelson

摘要:

纳米级系统中失去平衡的加热至关重要,对技术应用产生影响,并且对实验表征构成挑战。先前使用纳米结的实验主要集中在离子自由度的加热上,而电子的加热大多被忽略。我们报告测量原子尺度的Au断裂结,其中偏置驱动的电流噪声分量被用作探针的电子分布。在低偏置($<$ 150 mV)下,噪声与固定电子温度下的散粒噪声预期值一致。在较高的偏置,观察到的噪声功率的非线性依赖。我们考虑这种增加的候选机制,包括闪烁噪声(由于离子运动),加热的散装电极,非平衡电子-声子效应,和局部加热的电子分布冲击弹道结。我们发现,闪烁噪声和批量加热是定量不太可能解释的意见。我们讨论了这些意见的影响,其他纳米系统,和实验测试,以区分振动和电子相互作用机制的增强噪声。

英文摘要:

Heating in nanoscale systems driven out of equilibrium is of fundamental importance, has ramifications for technological applications, and is a challenge to characterize experimentally. Prior experiments using nanoscale junctions have largely focused on heating of ionic degrees of freedom, while heating of the electrons has been mostly neglected. We report measurements in atomic-scale Au break junctions, in which the bias-driven component of the current noise is used as a probe of the electronic distribution. At low biases ($<$ 150~mV) the noise is consistent with expectations of shot noise at a fixed electronic temperature. At higher biases, a nonlinear dependence of the noise power is observed. We consider candidate mechanisms for this increase, including flicker noise (due to ionic motion), heating of the bulk electrodes, nonequilibrium electron-phonon effects, and local heating of the electronic distribution impinging on the ballistic junction. We find that flicker noise and bulk heating are quantitatively unlikely to explain the observations. We discuss the implications of these observations for other nanoscale systems, and experimental tests to distinguish vibrational and electron interaction mechanisms for the enhanced noise.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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