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arXiv 1306.5400astro-ph.IM
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Astro-H卫星X射线CCD相机P沟道CCD的质子辐射损伤实验

Proton Radiation Damage Experiment on P-Channel CCD for an X-ray CCD camera onboard the Astro-H satellite

Koji Mori, Yusuke Nishioka, Satoshi Ohura, Yoshiaki Koura, Makoto Yamauchi, Hiroshi Nakajima, Shutaro Ueda, Hiroaki Kan, Naohisa Anabuki, Ryo Nagino, Kiyoshi Ha… 展开作者

Koji Mori, Yusuke Nishioka, Satoshi Ohura, Yoshiaki Koura, Makoto Yamauchi, Hiroshi Nakajima, Shutaro Ueda, Hiroaki Kan, Naohisa Anabuki, Ryo Nagino, Kiyoshi Hayashida, Hiroshi Tsunemi, Takayoshi Kohmura, Shoma Ikeda, Hiroshi Murakami, Masanobu Ozaki, Tadayasu Dotani, Yukie Maeda, Kenshi Sagara

摘要:

本文报道了为Astro-H卫星X射线CCD相机研制的P沟道CCD的质子辐射损伤实验。该装置暴露于6.7 MeV的10^9 cm^{-2}质子。电荷转移效率(CTI)作为辐射剂量的函数进行测量。通过与朱雀卫星上的CCD相机6年来的CTI测量结果的比较,证实了新型P沟道CCD具有足够的抗辐射能力。我们还证实了电荷注入技术和降低工作温度有效地降低了我们器件的CTI。与其他P沟道CCD实验的比较也进行了讨论。

英文摘要:

We report on a proton radiation damage experiment on P-channel CCD newly developed for an X-ray CCD camera onboard the Astro-H satellite. The device was exposed up to 10^9 protons cm^{-2} at 6.7 MeV. The charge transfer inefficiency (CTI) was measured as a function of radiation dose. In comparison with the CTI currently measured in the CCD camera onboard the Suzaku satellite for 6 years, we confirmed that the new type of P-channel CCD is radiation tolerant enough for space use. We also confirmed that a charge-injection technique and lowering the operating temperature efficiently work to reduce the CTI for our device. A comparison with other P-channel CCD experiments is also discussed.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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