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arXiv 1306.2038cond-mat.mtrl-scicond-mat.mes-hallquant-ph
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拓扑绝缘体-绝缘铁磁体(Bi_2Se_3- EuS)界面的弱局域化效应

Emerging Weak Localization Effects on Topological Insulator-Insulating Ferromagnet (Bi_2Se_3-EuS) Interface

Qi I. Yang, Merav Dolev, Li Zhang, Jinfeng Zhao, Alexander D. Fried, Elizabeth Schemm, Min Liu, Alexander Palevski, Ann F. Marshall, Subhash H. Risbud, Aharon Kapitulnik

摘要:

在绝缘铁磁EuS上直接沉积拓扑绝缘体Bi_2Se_3薄膜。在居里温度(T_C)以下的零场附近观察到异常的负磁电阻,类似于弱的局域效应,而在T_C以上则恢复到正常的正磁电阻。当上下表面耦合时,只有厚度小于4 nm的Bi_2Se_3层才能观察到这种负磁电阻效应。这些结果为拓扑绝缘体和绝缘铁磁体之间存在邻近效应提供了证据,为实现三维拓扑绝缘体的半整数量子化反常霍尔效应奠定了基础.

英文摘要:

Thin films of topological insulator Bi_2Se_3 were deposited directly on insulating ferromagnetic EuS. Unusual negative magnetoresistance was observed near the zero field below the Curie temperature (T_C), resembling the weak localization effect; whereas the usual positive magnetoresistance was recovered above T_C. Such negative magnetoresistance was only observed for Bi_2Se_3 layers thinner than t~4nm, when its top and bottom surfaces are coupled. These results provide evidence for a proximity effect between a topological insulator and an insulating ferromagnet, laying the foundation for future realization of the half-integer quantized anomalous Hall effect in three-dimensional topological insulators.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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