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arXiv 1302.2883cond-mat.mes-hallcond-mat.mtrl-sci
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快速可靠地鉴定TaSe2晶体的原子级薄层

Fast and reliable identification of atomically thin layers of TaSe2 crystals

Andres Castellanos-Gomez, Efrén Navarro-Moratalla, Guillermo Mokry, Jorge Quereda, Elena Pinilla-Cienfuegos, Nicolás Agraït, Herre S. J. van der Zant, Eugenio C… 展开作者

Andres Castellanos-Gomez, Efrén Navarro-Moratalla, Guillermo Mokry, Jorge Quereda, Elena Pinilla-Cienfuegos, Nicolás Agraït, Herre S. J. van der Zant, Eugenio Coronado, Gary A. Steele, Gabino Rubio-Bollinger

摘要:

通过层状块状材料的机械剥离在表面上沉积干净且无缺陷的原子级薄的二维晶体薄片已被证明是一种强大的技术,但它需要一种快速、可靠且非破坏性的方式来识别一群厚薄片中的原子级薄薄片。在这项工作中,我们提供了一般的指导方针,以确定TaSe2的微晶片通过光学显微镜和拉曼光谱。此外,我们确定了最佳的基板,以促进原子级薄的TaSe 2晶体的光学识别。实验实现和隔离的TaSe2的双折射层,使未来的研究中的有趣的现象,如超导性和电荷密度波的维度的作用。

英文摘要:

Deposition of clean and defect-free atomically thin two-dimensional crystalline flakes on surfaces by mechanical exfoliation of layered bulk materials has proven to be a powerful technique, but it requires a fast, reliable and non-destructive way to identify the atomically thin flakes among a crowd of thick flakes. In this work, we provide general guidelines to identify ultrathin flakes of TaSe2 by means of optical microscopy and Raman spectroscopy. Additionally, we determine the optimal substrates to facilitate the optical identification of atomically thin TaSe2 crystals. Experimental realization and isolation of ultrathin layers of TaSe2 enables future studies on the role of the dimensionality in interesting phenomena such as superconductivity and charge density waves.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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