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arXiv 1301.7490cond-mat.mes-hall
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热噪声下偶极耦合多铁性纳米磁体的开关:纳米磁逻辑的可靠性

Switching of Dipole Coupled Multiferroic Nanomagnets in the Presence of Thermal Noise: Reliability of Nanomagnetic Logic

Mohammad Salehi Fashami, Kamaram Munira, Supriyo Bandyopadhyay, Avik W Ghosh, Jayasimha Atulasimha

摘要:

通过求解单畴宏观自旋态的随机Landau-Lifshitz-Gilbert(LLG)方程,数值研究了偶极耦合到硬纳米磁体的多铁性纳米磁体的应力诱导开关行为.不同的因素被发现在室温下的热噪声的存在下,影响切换概率:(i)偶极耦合强度,(ii)应力水平,和(iii)应力撤回率(斜坡率)。我们报告说,热加宽的磁化分布导致大的开关错误率。这可能使依赖偶极耦合来执行布尔逻辑运算的纳米磁性逻辑方案不切实际,无论它们是通过应力或场或其他手段来计时。

英文摘要:

The stress-induced switching behavior of a multiferroic nanomagnet, dipole coupled to a hard nanomagnet, is numerically studied by solving the stochastic Landau-Lifshitz-Gilbert (LLG) equation for a single domain macro-spin state. Different factors were found to affect the switching probability in the presence of thermal noise at room temperature: (i) dipole coupling strength, (ii) stress levels, and (iii) stress withdrawal rates (ramp rates). We report that the thermal broadening of the magnetization distribution causes large switching error rates. This could render nanomagnetic logic schemes that rely on dipole coupling to perform Boolean logic operations impractical whether they are clocked by stress or field or other means.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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