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arXiv 1111.6129cond-mat.mes-hall
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热涨落作用下多铁性器件应力诱导开关的能量耗散和开关延迟

Energy dissipation and switching delay in stress-induced switching of multiferroic devices in the presence of thermal fluctuations

Kuntal Roy, Supriyo Bandyopadhyay, Jayasimha Atulasimha

摘要:

已知利用电压产生的应力切换形状各向异性的2相多铁性纳米磁体的磁化在0 K温度下耗散非常少的能量(对于$\sim$ 0.5 ns的切换时间,$<$ 1 aJ)。在这里,我们通过求解随机Landau-Lifshitz-Gilbert方程表明,在{\it室温}下,开关可以在小于1 ns的时间内以$\sim$ 100%的概率进行,同时耗散小于2 aJ。这使得基于应力诱导磁反转的纳米磁逻辑和存储器系统成为现存最节能的计算硬件之一。我们还研究了能量耗散,开关延迟,和开关所需的临界应力的依赖关系,在该应力斜升或斜降的速率。

英文摘要:

Switching the magnetization of a shape-anisotropic 2-phase multiferroic nanomagnet with voltage-generated stress is known to dissipate very little energy ($<$ 1 aJ for a switching time of $\sim$0.5 ns) at 0 K temperature. Here, we show by solving the stochastic Landau-Lifshitz-Gilbert equation that switching can be carried out with $\sim$100% probability in less than 1 ns while dissipating less than 2 aJ at {\it room temperature}. This makes nanomagnetic logic and memory systems, predicated on stress-induced magnetic reversal, one of the most energy-efficient computing hardware extant. We also study the dependence of energy dissipation, switching delay, and the critical stress needed to switch, on the rate at which stress is ramped up or down.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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