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arXiv 1209.3237cond-mat.mes-hallcond-mat.mtrl-sci
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InAs纳米线中的陷阱电荷动力学

Trapped charge dynamics in InAs nanowires

Gregory W. Holloway, Yipu Song, Chris M. Haapamaki, Ray R. LaPierre, Jonathan Baugh

摘要:

我们研究了InAs纳米线场效应晶体管电导中由于缺陷中的单电子陷阱引起的随机电报噪声。测量的电子捕获和发射时间作为温度和栅极电压的函数的个别陷阱,并与陷阱驻留在几个纳米厚的原生氧化物,与库仑势垒捕获一致。这些结果表明,从纳米线表面去除氧化物,适当的钝化,以防止再生长,应导致减少或消除随机电报噪声,在单电子水平的敏感实验的一个重要障碍。

英文摘要:

We study random telegraph noise in the conductance of InAs nanowire field-effect transistors due to single electron trapping in defects. The electron capture and emission times are measured as functions of temperature and gate voltage for individual traps, and are consistent with traps residing in the few-nanometer-thick native oxide, with a Coulomb barrier to trapping. These results suggest that oxide removal from the nanowire surface, with proper passivation to prevent regrowth, should lead to the reduction or elimination of random telegraph noise, an important obstacle for sensitive experiments at the single electron level.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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