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arXiv 1204.4574cond-mat.mes-hall
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含结构缺陷的2D石墨烯的输运性质

Transport properties of 2D graphene containing structural defects

Aurelien Lherbier, Simon M. -M. Dubois, Xavier Declerck, Yann-Michel Niquet, Stephan Roche, Jean-Christophe Charlier

摘要:

我们提出了一个广泛的报告,在二维石墨烯中存在的结构缺陷的电子输运的模拟。在sp $^2$碳基材料中的各种缺陷中,我们专注于斯通-威尔士缺陷和两种双空位型重构缺陷。首先,基于从头计算,一个紧束缚模型来描述这些缺陷的电子结构。然后,半经典输运性质,包括弹性平均自由程,迁移率和电导率使用一个N阶实空间Kubo-Greenwood方法计算。随着缺陷密度的增加,逐渐观察到最小电导率($σ^{min}_{sc}= 4e^2/πh$)的平台。电导率衰减到$σ^{min}_{sc}$的这种饱和与缺陷相关的共振能量有关。最后,局部化现象被捕获超出半经典制度。安德森过渡预测与几十纳米的顺序的缺陷密度约1%的本地化长度。

英文摘要:

We propose an extensive report on the simulation of electronic transport in 2D graphene in presence of structural defects. Amongst the large variety of such defects in sp$^2$ carbon-based materials, we focus on the Stone-Wales defect and on two divacancy-type reconstructed defects. First, based on ab initio calculations, a tight-binding model is derived to describe the electronic structure of these defects. Then, semiclassical transport properties including the elastic mean free paths, mobilities and conductivities are computed using an order-N real-space Kubo-Greenwood method. A plateau of minimum conductivity ($σ^{min}_{sc}= 4e^2/πh$) is progressively observed as the density of defects increases. This saturation of the decay of conductivity to $σ^{min}_{sc}$ is associated with defect-dependent resonant energies. Finally, localization phenomena are captured beyond the semiclassical regime. An Anderson transition is predicted with localization lengths of the order of tens of nanometers for defect densities around 1%.

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