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arXiv 1202.4029cond-mat.mes-hall
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拓扑绝缘体Bi $_{0.91}$ Sb $_{0.09}$表面态的磁光朗道能级谱

Landau level spectroscopy of surface states in the topological insulator Bi$_{0.91}$Sb$_{0.09}$ via magneto-optics

A. A. Schafgans, A. A. Taskin, Yoichi Ando, Xiao-Liang Qi, B. C. Chapler, K. W. Post, D. N. Basov

摘要:

我们对三维拓扑绝缘体Bi $_{0.91}$ Sb $_{0.09}$进行了宽带零场和磁红外光谱研究。零场的结果使我们能够测量的值之间的直接带隙的导电$L_a$和价$L_s$带。在法拉第几何(\emph{k} $||$ \emph{H} $||$ C1)中的外加场下,我们测量了大量朗道能级(LL)跃迁的存在,所有这些跃迁都具有频率依赖性$ω\propto \sqrt{H}$。我们讨论了拓扑绝缘体的表面和体积性质的观察的衍生物。

英文摘要:

We have performed broad-band zero-field and magneto-infrared spectroscopy of the three dimensional topological insulator Bi$_{0.91}$Sb$_{0.09}$. The zero-field results allow us to measure the value of the direct band gap between the conducting $L_a$ and valence $L_s$ bands. Under applied field in the Faraday geometry (\emph{k} $||$ \emph{H} $||$ C1), we measured the presence of a multitude of Landau level (LL) transitions, all with frequency dependence $ω\propto \sqrt{H}$. We discuss the ramification of this observation for the surface and bulk properties of topological insulators.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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