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arXiv 1201.4294cond-mat.mtrl-scicond-mat.mes-hall
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GaN自发极化的直接实验测定

Direct experimental determination of the spontaneous polarization of GaN

Jonas Lähnemann, Oliver Brandt, Uwe Jahn, Carsten Pfüller, Claudia Roder, Pinar Dogan, Frank Grosse, Abderrezak Belabbes, Friedhelm Bechstedt, Achim Trampert, Lutz Geelhaar

摘要:

我们提出了一个通用的方法来确定的纤锌矿半导体的自发极化Psp从激子的发射能量绑定到这些晶体中的不同类型的堆垛层错。利用显微光致发光谱和阴极发光光谱,我们观察到了无应变GAN微晶中本征和非本征层错的发射谱线。通过将与这些堆垛层错相关联的极化片电荷视为平板电容器,可以从所观察到的跃迁能量获得Psp,而无需额外的假设。自洽的泊松-薛定谔计算,辅以微观静电势计算使用密度泛函理论,导致几乎相同的值Psp。我们建议GAN的Psp值为-0.022+/-0.007 C/m^{2}。

英文摘要:

We present a universal approach for determining the spontaneous polarization Psp of a wurtzite semiconductor from the emission energies of excitons bound to the different types of stacking faults in these crystals. Employing micro-photoluminescence and cathodoluminescence spectroscopy, we observe emission lines from the intrinsic and extrinsic stacking faults in strain-free GaN micro-crystals. By treating the polarization sheet charges associated with these stacking faults as a plate capacitor, Psp can be obtained from the observed transition energies with no additional assumptions. Self-consistent Poisson-Schroedinger calculations, aided by the microscopic electrostatic potential computed using density-functional theory, lead to nearly identical values for Psp. Our recommended value for Psp of GaN is -0.022+/-0.007 C/m^{2}.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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