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arXiv 1109.2995quant-ph
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离子阱中贴片电位电场噪声的有限几何模型

Finite geometry models of electric field noise from patch potentials in ion traps

Guang Hao Low, Peter F. Herskind, Isaac L. Chuang

摘要:

我们通过考虑离子阱电极的有限几何形状,对导电表面上波动的贴片电位产生的电场噪声进行建模,以深入了解离子阱中异常加热的起源。与表面距离,$d$,异常加热率的缩放,获得几个通用的几何形状的相关电流离子阱设计,从平面到球形电极。补丁大小的影响进行了研究,通过求解拉普拉斯方程在适当的格林函数,以及通过本征函数展开。与表面距离的缩放被发现是高度依赖于几何形状的选择和电极的空间范围,离子电极的距离,和补丁大小之间的相对规模。我们的模型一般支持$d^{-4}$依赖目前发现的大多数实验和模型,但也预测几何驱动偏离这一趋势。

英文摘要:

We model electric field noise from fluctuating patch potentials on conducting surfaces by taking into account the finite geometry of the ion trap electrodes to gain insight into the origin of anomalous heating in ion traps. The scaling of anomalous heating rates with surface distance, $d$, is obtained for several generic geometries of relevance to current ion trap designs, ranging from planar to spheroidal electrodes. The influence of patch size is studied both by solving Laplace's equation in terms of the appropriate Green's function as well as through an eigenfunction expansion. Scaling with surface distance is found to be highly dependent on the choice of geometry and the relative scale between the spatial extent of the electrode, the ion-electrode distance, and the patch size. Our model generally supports the $d^{-4}$ dependence currently found by most experiments and models, but also predicts geometry-driven deviations from this trend.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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