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arXiv 1104.3835quant-ph
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无层析成像的量子器件的实际表征

Practical characterization of quantum devices without tomography

Marcus P. da Silva, Olivier Landon-Cardinal, David Poulin

摘要:

量子层析成像是用于评估量子信息处理设备质量的主要方法,但其复杂性对即使是中等规模的系统的表征也是一个主要障碍。提取关于设备的完整信息所需的实验设置的数量随着其大小呈指数级增长,处理这些实验生成的数据的运行时间也是如此。问题的部分原因是断层扫描产生的信息比通常所寻求的要多得多。采取更有针对性的方法,我们开发的计划,使(i)估计的保真度的实验的理论理想的描述,(ii)学习减少子集内的描述最匹配的实验数据。与断层扫描相比,这两种方法都显著减少了资源。特别是,我们证明,保真度可以估计从一些简单的实验设置,是独立的系统的大小,消除了一个重要的路障较大的量子信息处理单元的实验研究。

英文摘要:

Quantum tomography is the main method used to assess the quality of quantum information processing devices, but its complexity presents a major obstacle for the characterization of even moderately large systems. The number of experimental settings required to extract complete information about a device grows exponentially with its size, and so does the running time for processing the data generated by these experiments. Part of the problem is that tomography generates much more information than is usually sought. Taking a more targeted approach, we develop schemes that enable (i) estimating the fidelity of an experiment to a theoretical ideal description, (ii) learning which description within a reduced subset best matches the experimental data. Both these approaches yield a significant reduction in resources compared to tomography. In particular, we demonstrate that fidelity can be estimated from a number of simple experimental settings that is independent of the system size, removing an important roadblock for the experimental study of larger quantum information processing units.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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