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arXiv 1104.3467cond-mat.mes-hall
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评“半导体-绝缘体-金属界面附近的浅施主态”

Comment on "Shallow donor states near a semiconductor-insulator-metal interface"

L. F. Makarenko, O. A. Lavrova

摘要:

在最近的论文中,Hao等人[Phys.Rev.B80,035329(2009)]报道了用新型试探波函数对半导体/绝缘体/金属结构中的浅类氢施主的能谱进行变分计算。他们还对半导体/绝缘体系统进行了计算,发现他们的方法给出的能量值低于MacMillen和Landman [Phys.Rev.B29,4524(1984)]得到的能量值。从这些结果中,麦克米伦和兰德曼得到的能量值误差比他们预期的要大得多。但我们证实MacMillen和Landman提出的理论方法对半导体-绝缘体界面附近的类氢施主体系给出了相当准确的能量值。

英文摘要:

In a recent paper Hao et al. [Phys. Rev. B 80, 035329 (2009)] reported variational calculations of energy spectrum for shallow hydrogenic donor in the structure of semiconductor/insulator/metal with a new type of trial wave function. They also performed calculations for semiconductor/insulator system and found that their method gives energy values lower than those obtained by MacMillen and Landman [Phys. Rev. B 29, 4524 (1984)]. As follows from these results MacMillen and Landman have got much larger errors in energy values than they expected. However we confirm that the theoretical approach suggested by MacMillen and Landman gives rather accurate energy values for the system of hydrogenic donor near the interface between semiconductor and insulator.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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